Shelfmark

CSI.224

Maker

Cambridge Instrument Company Ltd

Subjects

microscopes (scanning electron microscope)

Title

A Study Of Fatigue And Impact Fractures With The Scanning Electron Microscope By J.T. McGrath, J.G. Buchanan, and R.C.A.Thurston Reprinted From The Journal Of The Institute Of Metals, September 1962

Description

An Investigation into the characteristics of fatigue and impact-fracture surfaces with a scanning electron microscope.

Earliest Date

Latest Date

Pages

6

Address

13, Grosvenor Place, London, S.W.1 [England]

Other Makers

Cat no

Reprint E13

Contents List

Hardback

Prices

Index

Illustrations

Yes

General Ref