Shelfmark

Csi.1072

Maker

Cambridge Scientific Instruments Limited

Subjects

microscan 3 X-ray microanalysis system: Specifications: electron-gun; EHT supplies; filament supply; grid bias; electromagnetic condenser lenses; lens supplies; second condenser lens apertures; stigmator; beam alignment; probe diameter; magnification; specimen size; standards; exit ports; air-lock; orthogonal specimen traverses; motorised orthogonal specimen traverses; specimen step-scanning; specimen movement along beam axis (Z control); probe scanning system

Title

Cambridge Microscan 3 X-Ray Microanalysis System 3. Specimen and Probe Facilities

Description

Pictures and short descriptions of the technical specifications of instruments.

Earliest Date

1969

Latest Date

1969

Pages

3

Address

Cambridge Scientific Instruments Limited, Electron-probe division, Chesterton Road, Cambridge, CB$ 3AW, England

Other Makers

Cat no

Leaflet no. 17702

Contents List

Hardback

Prices

Index

Illustrations

Yes

General Ref