Shelfmark

Csi.1081

Maker

Cambridge Scientific Instruments Limited

Subjects

microscan 5 X-ray microanalysis system: Electron-probe and specimen facilities; electron-gun; EHT supplies; filament supply; grid bias; elctromagnetic condenser lenses; lens supplies; second condenser lens apertures; stigmator; beam alignment; probe diameter; magnification; specimen size; standards; etc.; exit ports; air-lock; orthogonal specimen traverses; motorised orthogonal specimen tracerses; specimen step-scanning; specimen movement along beam axis; probe scanning system; large area scanning system

Title

Cambridge Microscan 5 X-Ray Microanalysis System 3. Electron-probe and specimen facilities

Description

Pictures and short descriptions of the technical specifications of instruments.

Earliest Date

1969

Latest Date

1969

Pages

4

Address

Cambridge Scientific Instruments Limited, Electron-Probe Division, Chesterton Road, Cambridge, CB4 3AW, England

Other Makers

Cat no

Leaflet no. 17902

Contents List

Hardback

Prices

Index

Illustrations

Yes

General Ref